Faculty Center

Featured Professor

Cher Ming Tan
Associate Professor
Nanyang Technological University of Singapore
School of Electrical and Electronic Engineering
Division of Microelectronics
http://www.ntu.edu.sg/eee/eee6/

Course Offerings:

• E202: Analog Electronics
• E494: IC Yield and Reliability
• E6602: Quality and Reliability Engineering
• E6606: Failure Mechanisms in Semiconductor Devices

Reliability is crucial for engineering products, and reliability tests have become essential in most manufacturing. However, due to the complexity of reliability data analysis, oversimplified analyses often lead to erroneous conclusions.

Using the powerful mathematical capabilities of MATLAB®, one can perform complex analyses of reliability data. With MATLAB, we can perform our analyses easily and without making oversimplified assumptions. Moreover, students need not be distracted by the underlying mathematics but can instead focus on the data analysis and examine the consequences of their assumptions.

Various methods have been employed to shorten reliability test times. Noise analysis is one of the most promising methods. With MATLAB's powerful Signal Processing Toolbox, we have developed a new algorithm to reveal information embedded in noise signals from electrical systems, thus shedding light on the degradation process leading to system failures.

The MathWorks products are very useful for complex engineering analyses. Recent advancements have led to the availability of various mathematical approaches for determining the physics of failure. When coupled with the powerful computational capability of The MathWorks products, these methods make complex analyses of product failures possible.

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