N-Channel MOSFET - Model N-Channel MOSFET using Shichman-Hodges equation

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Semiconductor Devices

Description

The N-Channel MOSFET block uses the Shichman and Hodges equations [1] for an insulated-gate field-effect transistor to represent an N-Channel MOSFET.

The drain-source current, IDS, depends on the region of operation:

In the preceding equations:

The block models gate junction capacitance as a fixed gate-drain capacitance CGD and a fixed gate-source capacitance CGS. If you select Specify using equation parameters directly for the Parameterization parameter in the Junction Capacitance tab, you specify these values directly using the Gate-drain junction capacitance and Gate-source junction capacitance parameters. Otherwise, the block derives them from the Input capacitance C_iss and Reverse transfer capacitance Crss parameter values. The two parameterizations are related as follows:

Dialog Box and Parameters

Main Tab

Parameterization

Select one of the following methods for block parameterization:

Drain-source on resistance, R_DS(on)

The ratio of the drain-source voltage to the drain current for specified values of drain current and gate-source voltage. RDS(on) should have a positive value. This parameter is only visible when you select Specify from a datasheet for the Parameterization parameter. The default value is 0.025 Ω.

Drain current, Ids, for R_DS(on)

The drain current the block uses to calculate the value of the drain-source resistance. IDS should have a positive value. This parameter is only visible when you select Specify from a datasheet for the Parameterization parameter. The default value is 6 A.

Gate-source voltage, Vgs, for R_DS(on)

The gate-source voltage the block uses to calculate the value of the drain-source resistance. VGS should have a positive value. This parameter is only visible when you select Specify from a datasheet for the Parameterization parameter. The default value is 10 V.

Gain K

Positive constant gain coefficient for the Shichman and Hodges equations. This parameter is only visible when you select Specify using equation parameters directly for the Parameterization parameter. The default value is 5 A/V2.

Gate-source threshold voltage Vth

Gate-source threshold voltage Vth in the Shichman and Hodges equations. For an enhancement device, Vth should be positive. For a depletion mode device, Vth should be negative. The default value is 1.7 V.

Ohmic Resistance Tab

Source ohmic resistance

The transistor source resistance. The default value is 0.001 Ω. The value must be greater than or equal to 0.

Drain ohmic resistance

The transistor drain resistance. The default value is 0.001 Ω. The value must be greater than or equal to 0.

Junction Capacitance Tab

Parameterization

Select one of the following methods for capacitance parameterization:

Input capacitance C_iss

The gate-source capacitance with the drain shorted to the source. This parameter is only visible when you select Specify from a datasheet for the Parameterization parameter. The default value is 350 pF.

Reverse transfer capacitance Crss

The drain-gate capacitance with the source connected to ground. This parameter is only visible when you select Specify from a datasheet for the Parameterization parameter. The default value is 80 pF.

Gate-source junction capacitance

The value of the capacitance placed between the gate and the source. This parameter is only visible when you select Specify using equation parameters directly for the Parameterization parameter. The default value is 270 pF.

Gate-drain junction capacitance

The value of the capacitance placed between the gate and the drain. This parameter is only visible when you select Specify using equation parameters directly for the Parameterization parameter. The default value is 80 pF.

Ports

The block has the following ports:

G

Electrical conserving port associated with the transistor gate terminal.

D

Electrical conserving port associated with the transistor drain terminal.

S

Electrical conserving port associated with the transistor source terminal.

References

[1] H. Shichman and D. A. Hodges. "Modeling and simulation of insulated-gate field-effect transistor switching circuits." IEEE J. Solid State Circuits, SC-3, 1968.

See Also

P-Channel MOSFET

  


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