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SPICE-Compatible Semiconductors
The PMOS block represents a SPICE-compatible P-channel MOSFET.
The PMOS block model includes the following components:
The following table shows how the PMOS block calculates the transistor drain resistance. The abbreviations in the table represent the values of the following block parameters:
Drain resistance, RD
Sheet resistance, RSH
Number of drain squares, NRD
| Drain resistance, RD Parameter | Sheet resistance, RSH Parameter | Drain Resistance |
|---|---|---|
| NaN | NaN | 0 |
| RD | NaN or RSH | RD |
| NaN | RSH | RSH*NRD |
The following table shows how the PMOS block calculates the transistor source resistance. The abbreviations in the table represent the values of the following block parameters:
Source resistance, RS
Sheet resistance, RSH
Number of source squares, NRS
| Source resistance, RS Parameter | Sheet resistance, RSH Parameter | Source Resistance |
|---|---|---|
| NaN | NaN | 0 |
| RS | NaN or RSH | RS |
| NaN | RSH | RSH*NRS |
The block provides the following relationship between the bulk-source current Isb and the bulk-source voltage Vsb after adjusting the applicable model parameters for temperature.
| Applicable Range of Vsb Values | Corresponding Igs Equation |
|---|---|
|
|
|
|
Where:
ISsb is
The product of the Bulk jct sat current density, JS parameter value and the Area of source, AS parameter value if both these parameter values and the Area of drain, AD parameter value are nonzero.
The Bulk saturation current, IS parameter value, otherwise.
Vtn=NkT/q
q is the elementary charge on an electron, 1.6021918e-19 C.
N is the Emission coefficient, ND parameter value.
k is the Boltzmann constant.
T is the diode temperature:
If you select Device temperature for the Model temperature dependence using parameter, T is the sum of the Circuit temperature value plus the Offset local circuit temperature, TOFFSET parameter value. The Circuit temperature value comes from the SPICE Environment Parameters block, if one exists in the circuit. Otherwise, it comes from the default value for this block.
If you select Fixed temperature for the Model temperature dependence using parameter, T is the Fixed circuit temperature, TFIXED parameter value.
GMIN is the diode minimum conductance. By default, GMIN matches the Minimum conductance GMIN parameter of the SPICE Environment Parameters block, whose default value is 1e-12. To change GMIN, add a SPICE Environment Parameters block to your model and set the Minimum conductance GMIN parameter to the desired value.
The block provides the following relationship between the bulk-drain current Idb and the bulk-drain voltage Vdb after adjusting the applicable model parameters for temperature.
| Applicable Range of Vdb Values | Corresponding Igs Equation |
|---|---|
|
|
|
|
Where:
ISdb is
The product of the Bulk jct sat current density, JS parameter value and the Area of drain, AD parameter value if both these parameter values and the Area of source, AS parameter value are nonzero.
The Bulk saturation current, IS parameter value, otherwise.
The block provides the following relationship between the drain
current Isd and the drain-source
voltage Vsd in normal
mode (
) after adjusting the applicable
model parameters for temperature.
Normal Mode
| Applicable Range of Vsg and Vsd Values | Corresponding Isd Equation |
|---|---|
|
|
|
|
|
|
Where:
Von is:
if
.
if
.
MTYPE*VBI if Vsb > 2*PHI.
MTYPE is –1.
BETA is KP*WIDTH/(LENGTH-2*LD)
KP is:
The Transconductance, KP parameter value, if this parameter has a numerical value.
, if Transconductance,
KP is NaN and you specify values for
both the Oxide thickness, TOX and Substrate
doping, NSUB parameters.
WIDTH is the Width of channel, WIDTH parameter value.
LENGTH is the Length of channel, LENGTH parameter value.
LD is the Lateral diffusion, LD parameter value.
VBI is an built-in voltage value the block uses in calculations. The value is a function of temperature. For a detailed definition, see Temperature Dependence.
PHI is:
The Surface potential, PHI parameter value, if this parameter has a numerical value.
, if Surface
potential, PHI is NaN and you specify
values for both the Oxide thickness, TOX and Substrate
doping, NSUB parameters.
LAMBDA is the Channel modulation, LAMBDA parameter value.
GAMMA is:
The Bulk threshold, GAMMA parameter value, if this parameter has a numerical value.
, if Bulk
threshold, GAMMA is NaN and you specify
values for both the Oxide thickness, TOX and Substrate
doping, NSUB parameters.
ε0 is the permittivity of free space, 8.854214871e-12 F/m.
ni is the carrier concentration of intrinsic silicon, 1.45e10 cm-3.
The block provides the following relationship between the drain
current Isd and the drain-source
voltage Vsd in inverse
mode (
) after adjusting the applicable
model parameters for temperature.
Inverse Mode
| Applicable Range of Vdg and Vsd Values | Corresponding Isd Equation |
|---|---|
|
|
|
|
|
|
Where:
Von is:
if
![]()
.
if
![]()
.
MTYPE*VBI if Vdb > 2*PHI.
The block provides the following model for drain current Isd
in normal mode (
) after adjusting
the applicable model parameters for temperature.
![]()
Where:
ISD0 is the Basic Drain Current Model.
ScaleVMAX is the Velocity Saturation Scaling.
ScaleLChan is the Channel Length Modulation Scaling.
ScaleINV is the Weak Inversion Scaling.
The blocks uses the same model for drain current in inverse
mode (
), with the following substitutions:
Vsb – Vsd for Vsb
Vsg – Vsd for Vsd
–Vsd for Vsd
The block provides the following relationship between the drain current Isd and the drain-source voltage Vds:
![]()
The block calculates BETA as described in Level 1 Drain Current Model.
The block calculates FGATE using the following equation:
![]()
THETA is the Vgs dependence on mobility, THETA parameter value.
![]()
If you specify a nonzero value for the Fast surface state density, NFS parameter, the block calculates Von using the following equation:
![]()
Otherwise, Von = VTH.
The block calculates xn using the following equation:

The block calculates Vbulk as follows:
If VSB ≤ 0, Vbulk = PHI – VBS.
Otherwise, the block calculates Vbulk using the following equation:

VT=kT/q
The block calculates VTH using the equation following equation:

For information about how the block calculates VBI, see Temperature Dependence.
ETA is the Vds dependence threshold volt, ETA parameter value.
COX = εox/TOX, where εox is the permittivity of the oxide and TOX is the Oxide thickness, TOX parameter value.
If you specify a nonzero value for the Junction depth, XJ parameter and a value for the Substrate doping, NSUB parameter, the block calculates Fs using the following equations:

where εsi is the permittivity of silicon.
Otherwise, Fs = 1.
The block calculates FB using the following equation:
![]()
The block calculates Fn using the following equation:
![]()
DELTA is the Width effect on threshold, DELTA parameter value.
VSDX is the lesser of VSD and the saturation voltage, Vdsat.
If you specify a positive value for the Max carrier drift velocity, VMAX parameter, the block calculates Vdsat using the following equation:

Otherwise, the block calculates Vdsat using the following equation:
![]()
If you specify a positive value for the Max carrier drift velocity, VMAX parameter, the block calculates ScaleVMAX using the following equation:

Otherwise, ScaleVMAX = 1.
The block scales the drain current to account for channel length modulation if the block meets all of the following criteria:
VSD > Vsat
The Max carrier drift velocity, VMAX parameter value is zero or α is nonzero.
The block scales the drain current using the following equation:

The block uses the following procedure to calculate Δl:
The block first calculates the intermediate value Δl0.
If you specify a positive value for the Max carrier drift velocity, VMAX parameter, the block computes the intermediate value gdsat as the greater of 1e-12 and the result of the following equation:

where:
![]()
Then, the block uses the following equation to calculate the intermediate value Δl0:

where KA is the product of the Mobility modulation, KAPPA parameter value and α.
Otherwise, the block uses the following equation to calculate the intermediate value Δl0:
![]()
The block checks for punch through and calculates Δl.
If Δl0 is greater than (LENGTH-2*LD)/2, the block calculates Δl using the following equation:

Otherwise, Δl = Δl0.
If VSG is less than Von, the block calculates ScaleINV using the following equation:
![]()
Otherwise, ScaleINV = 1.
The block models the following junction charges:
Junction Overlap Charges
Bulk Junction Charges
The block calculates the following junction overlap charges:
QSG=CGSO*WIDTH*Vsg
Where:
QSG is the gate-source overlap charge.
CGSO is the G-S overlap capacitance, CGSO parameter value.
WIDTH is the Width of channel, WIDTH parameter value.
QDG=CGDO*WIDTH*Vdg
Where:
QDG is the gate-drain overlap charge.
CGDO is the G-D overlap capacitance, CGDO parameter value.
QBG=CGBO*(LENGTH-2*LD)*Vbg
Where:
QBG is the gate-bulk overlap charge.
CGBO is the G-B overlap capacitance, CGBO parameter value.
LENGTH is the Length of channel, LENGTH parameter value.
LD is the Lateral diffusion, LD parameter value.
The block provides the following relationship between the bulk-drain bottom junction charge Qbottom and the junction voltage Vdb after adjusting the applicable model parameters for temperature.
| Applicable Range of Vdb Values | Corresponding Qbottom Equation |
|---|---|
|
|
|
|
|
otherwise. |
Where:
PB is the Bulk junction potential, PB parameter value.
FC is the Capacitance coefficient FC parameter value.
CBD is the Zero-bias BD capacitance, CBD parameter value.
CJ is the Bottom junction cap per area, CJ parameter value.
AD is the Area of drain, AD parameter value.
MJ is the Bottom grading coefficient, MJ parameter value.

![]()
![]()
The block uses the equations in the preceding table to calculate the bulk-source bottom junction charge, with the following substitutions:
Vsb replaces Vdb.
AS (the Area of source, AS parameter value) replaces AD.
CBS (the Zero-bias BS capacitance, CBS parameter value) replaces CBD.
The block provides the following relationship between the bulk-drain sidewall junction charge Qsidewall and the junction voltage Vdb after adjusting the applicable model parameters for temperature.
| Applicable Range of Vdb Values | Corresponding Qsidewall Equation |
|---|---|
|
|
![]() |
|
|
![]() |
Where:
CJSW is the Side jct cap/area of jct perimeter, CJSW parameter value.
PD is the Perimeter of drain, AD parameter value.
MJSW is the Side grading coefficient, MJSW parameter value.

![]()
![]()
The block uses the equations in the preceding table to calculate the bulk-source sidewall junction charge and the sidewall junction voltage, with the following substitutions:
Vsb replaces Vdb.
PS (the Perimeter of source, PS parameter value) replaces PD.
Several transistor parameters depend on temperature. There are two ways to specify the transistor temperature:
When you select Device temperature for the Model temperature dependence using parameter, the transistor temperature is
![]()
where:
TC is the Circuit temperature parameter value from the SPICE Environment Parameters block. If this block doesn't exist in the circuit, TC is the default value of this parameter.
TO is the Offset local circuit temperature, TOFFSET parameter value.
When you select Fixed temperature for the Model temperature dependence using parameter, the transistor temperature is the Fixed circuit temperature, TFIXED parameter value.
The block provides the following relationship between the transconductance KP and the transistor temperature T:

where:
KP is the Transconductance, KP parameter value.
Tmeas is the Parameter extraction temperature, TMEAS parameter value.
The block provides the following relationship between the surface potential PHI and the transistor temperature T:

where:
![]()
![]()
The block provides the following relationship between the built-in voltage VBI and the transistor temperature T:

where:
VTO is:
The Threshold voltage, VTO parameter value, if this parameter has a numerical value.
![]()
, if Threshold voltage,
VTO is NaN and you specify values for
both the Oxide thickness, TOX and Substrate
doping, NSUB parameters.
Φ is:
3.2, if TPG (the Gate type?, TPG parameter value) is 0.
, otherwise.
GAMMA is:
The Bulk threshold, GAMMA parameter value, if this parameter has a numerical value.
, if Bulk
threshold, GAMMA is NaN and you specify
values for both the Oxide thickness, TOX and Substrate
doping, NSUB parameters.
The block provides the following relationship between the bulk saturation current IS and the transistor temperature T:
![]()
where:
ND is the Emission coefficient, ND parameter value.
IS is the Bulk saturation current, IS parameter value.
The block provides the following relationship between the bulk junction saturation current density JS and the transistor temperature T:
![]()
where:
JS is the Bulk jct sat current density, JS parameter value.
The block provides the following relationship between the bulk junction potential PB and the transistor temperature T:

where:
PB is the Bulk junction potential, PB parameter value.
The block provides the following relationship between the bulk-drain junction capacitance CBD and the transistor temperature T:

where:
CBD is the Zero-bias BD capacitance, CBD parameter value.
MJ is the Bottom grading coefficient, MJ parameter value.

The block uses the CBD(T) equation to calculate:
The bulk-source junction capacitance by substituting CBS (the Zero-bias BS capacitance, CBS parameter value) for CBD.
The bottom junction capacitance by substituting CJ (the Bottom junction cap per area, CJ parameter value) for CBD.
The block provides the following relationship between the sidewall junction capacitance CJSW and the transistor temperature T:

where:
MJSW is the Side grading coefficient, MJSW parameter value.
The model is based on the following assumptions:
The PMOS block does not support noise analysis.
The PMOS block applies initial conditions across junction capacitors and not across the block ports.

Select one of the following MOSFET model options:
Level 1 MOS — Use the Level 1 Drain Current Model. This is the default option.
Level 3 MOS — Use the Level 3 Drain Current Model.

The transistor area. This value multiplies the following parameter values:
Transconductance, KP
Bulk saturation current, IS
Bulk jct sat current density, JS
Zero-bias BD capacitance, CBD
Zero-bias BS capacitance, CBS
G-S overlap capacitance, CGSO
G-D overlap capacitance, CGDO
G-B overlap capacitance, CGBO
Bottom junction cap per area CJ
Side jct cap/area of jct perimeter CJSW
It divides the following parameter values:
Drain resistance, RD
Source resistance, RS
Sheet resistance, RSH
The default value is 1. The value must be greater than 0.
The number of parallel MOS instances for this device. This parameter multiplies the output current and device charge. The default value is 1. The value must be greater than 0.
Length of the channel between the source and drain. The default value is 1e-04 m.
Width of the channel between the source and drain. The default value is 1e-04 m.
Area of the transistor drain diffusion. The default value is 0 m2. The value must be greater than or equal to 0.
Area of the transistor source diffusion. The default value is 0 m2. The value must be greater than or equal to 0.
Perimeter of the transistor drain diffusion. The default value is 0 m.
Perimeter of the transistor source diffusion. The default value is 0 m.

The transistor drain ohmic resistance. The default value is Nan Ω. This value means the parameter is unspecified, so the block calculates the drain resistance as described in Resistance Calculations. The value must be equal to 0 or greater than or equal to Rmin. Rmin is a built-in model constant whose value is 1e-12.
The transistor source ohmic resistance. The default value is Nan Ω. This value means the parameter is unspecified, so the block calculates the drain resistance as described in Resistance Calculations. The value must be equal to 0 or greater than or equal to Rmin. Rmin is a built-in model constant whose value is 1e-12.
Resistance per square of the transistor source and drain. The default value is Nan Ω. This value means the parameter is unspecified. The block only uses this parameter value if you do not specify one or both of the Drain resistance, RD and Source resistance, RS parameter values, as described in Resistance Calculations. The value must be greater than or equal to 0.
Number of squares of resistance that make up the transistor drain diffusion. The default value is 1 . The value must be greater than or equal to 0. The block only uses this parameter value if you do not specify one or both of the Drain resistance, RD and Source resistance, RS parameter values, as described in Resistance Calculations.
Number of squares of resistance that make up the transistor source diffusion. The default value is 1 . The value must be greater than or equal to 0. The block only uses this parameter value if you do not specify one or both of the Drain resistance, RD and Source resistance, RS parameter values, as described in Resistance Calculations.

The gate-source voltage above which the transistor produces a nonzero drain current. The default value is 0 V. If you assign this parameter a value of NaN, the block calculates the value from the specified values of the Oxide thickness, TOX and Substrate doping, NSUB parameters. For more information about this calculation, see Temperature Dependence.
The derivative of drain current with respect to gate voltage. The default value is 2e-05 A/V2. The value must be greater than or equal to 0. If you assign this parameter a value of NaN, the block calculates the value from the specified values of the Oxide thickness, TOX and Substrate doping, NSUB parameters. For more information about this calculation, see Level 1 Drain Current Model or Level 3 Drain Current Model as appropriate for the selected value of the MOS model parameter.
Body effect parameter, which relates the threshold voltage,
VTH, to the body bias, VBS, as described in Level 1 Drain Current Model. The default value is 0
. The value must be greater than
or equal to 0. If you assign this parameter a
value of NaN, the block calculates the value from
the specified values of the Oxide thickness, TOX and Substrate
doping, NSUB parameters. For more information about this
calculation, see Level 1 Drain Current Model or Level 3 Drain Current Model as appropriate
for the selected value of the MOS model parameter.
Twice the voltage at which the surface electron concentration becomes equal to the intrinsic concentration and the device transitions between depletion and inversion conditions. The default value is 0.6 V. The value must be greater than or equal to 0. If you assign this parameter a value of NaN, the block calculates the value from the specified values of the Oxide thickness, TOX and Substrate doping, NSUB parameters. For more information about this calculation, see Level 1 Drain Current Model or Level 3 Drain Current Model as appropriate for the selected value of the MOS model parameter.
The channel-length modulation. This parameter is only visible when you select Level 1 MOS for the MOS model parameter. The default value is 0 1/V.
The magnitude of the current that the junction approaches asymptotically for very large reverse bias levels. The default value is 1e-14 A. The value must be greater than or equal to 0.
The magnitude of the current per unit area that the junction approaches asymptotically for very large reverse bias levels. The default value is 0 A/m2. The value must be greater than or equal to 0.
The transistor emission coefficient or ideality factor. The default value is 1. The value must be greater than 0.
The factor that controls the effect of transistor width on threshold voltage. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0.
The maximum drift velocity of the carriers. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0 m/s.
The fast surface state density adjusts the drain current for the mobility reduction caused by the gate voltage. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0 1/cm2.
The coefficient that controls how the threshold voltage depends on the drain-source voltage in the drain current calculation. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0.
The coefficient that controls how the mobility affects the gate voltage in the drain current calculation. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0 1/V.
The coefficient that controls how the mobility affects the channel length in the drain current calculation. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0.2.

Select one of the following options for modeling the junction capacitance:
No — Do not include junction capacitance in the model. This is the default option.
Yes — Specify zero-bias junction capacitance, junction potential, grading coefficient, forward-bias depletion and capacitance coefficient.
Gate-source capacitance due to the diffusion that occurs when the device operates in depletion mode. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F/m. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
Gate-drain capacitance due to the diffusion that occurs when the device operates in depletion mode. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F/m. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
Gate-base capacitance due to the diffusion that occurs when the device operates in depletion mode. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F/m. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
The value of the capacitance placed between the base and the drain. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
The value of the capacitance placed between the base and the source. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
Zero-bias bulk junction bottom capacitance per junction area. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F/m2. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
The transistor bottom grading coefficient. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0.5. The value must be equal to 0 or less than MGmax. MGmax is a built-in model constant whose value is 0.9.
Zero-bias bulk junction sidewall capacitance per junction perimeter. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0 F/m. The value must be equal to 0 or greater than or equal to Cmin. Cmin is a built-in model constant whose value is 1e-18.
The transistor sidewall grading coefficient. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0.5. The value must be equal to 0 or less than MGmax. MGmax is a built-in model constant whose value is 0.9.
The potential across the bulk junction. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0.8 V. The value must be equal to 0 or greater than or equal to VJmin. VJmin is a built-in model constant whose value is 0.01.
The fitting coefficient that quantifies the decrease of the depletion capacitance with applied voltage. This parameter is only visible when you select Yes for the Model junction capacitance parameter. The default value is 0.5. The value must be equal to 0 or less than or equal to FCmax. FCmax is a built-in model constant whose value is 0.95.
Select one of the following options for specifying an initial condition:
Drain-source voltage at the start of the simulation. This parameter is only visible when you select Yes for the Model junction capacitance and Yes for the Specify initial condition parameter. The default value is 0 V.
Gate-source voltage at the start of the simulation. This parameter is only visible when you select Yes for the Model junction capacitance and Yes for the Specify initial condition parameter. The default value is 0 V.
Bulk-source voltage at the start of the simulation. This parameter is only visible when you select Yes for the Model junction capacitance and Yes for the Specify initial condition parameter. The default value is 0 V.

Thickness of the gate oxide. The default value is NaN m. The value must be greater than or equal to 0.
Length of lateral diffusion. The default value is 0 m.
Substrate doping. The default value is NaN 1/cm3. The value must be greater than or equal to 1.45e10 (the carrier concentration of intrinsic silicon).
Substrate doping. The default value is 0 1/cm2.
Zero-bias surface mobility coefficient. The default value is 600 cm2/V/s.
Junction depth. This parameter is only visible when you select Level 3 MOS for the MOS model parameter. The default value is 0 m.
Select one of the following MOSFET gate materials (as compared to the substrate):
Opposite of substrate — The gate material is the opposite of the substrate. This means that TPG = 1 in the device equations. This is the default option.
Same as substrate — The gate material is the same as the substrate. This means that TPG = –1 in the device equations.
Aluminum — The gate material is aluminum. This means that TPG = 0 in the device equations.

Select one of the following options for modeling the diode temperature dependence:
Device temperature — Use the device temperature, which is the Circuit temperature value plus the Offset local circuit temperature, TOFFSET value. The Circuit temperature value comes from the SPICE Environment Parameters block, if one exists in the circuit. Otherwise, it comes from the default value for this block.
Fixed temperature — Use a temperature that is independent of the circuit temperature to model temperature dependence.
The amount by which the transistor temperature differs from the circuit temperature. This parameter is only visible when you select Device temperature for the Model temperature dependence using parameter. The default value is 0 K.
The temperature at which to simulate the transistor. This parameter is only visible when you select Fixed temperature for the Model temperature dependence using parameter. The default value is 300.15 K. The value must be greater than 0.
The temperature at which the transistor parameters were measured. The default value is 300.15 K. The value must be greater than 0.
The block has the following ports:
Electrical conserving port associated with the transistor gate terminal.
Electrical conserving port associated with the transistor drain terminal.
Electrical conserving port associated with the transistor source terminal.
Electrical conserving port associated with the transistor bulk terminal.
[1] G. Massobrio and P. Antognetti. Semiconductor Device Modeling with SPICE. 2nd Edition, McGraw-Hill, 1993. Chapter 3.
![]() | PJFET | PNP | ![]() |

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