EE Times Virtual Conference

Connected Devices: Entering a New Age in Embedded Design.

The MathWorks is participating in the “Development and Test Tools” panel discussion, part of the EE Times Virtual Conference “Connected Devices: Entering a New Age in Embedded Design.”

Date: Thursday, November 12
Time: 1:00-2:00 EST.

Despite the ever-increasing complexity and capability of embedded systems, their designers are now being asked more than ever to shorten the development and testing cycles for new products and new features. Achieving additional complexity in less time is a serious challenge, and doing this is likely to result in higher levels of bugs and expensive product recalls or upgrades. Success demands that software and hardware testing teams work more closely together than ever to allow new features to be added in a more reliable manner while also starting testing earlier. Panelists experienced with advanced simulation and hardware testing tools join a moderated discussion of the opportunities and challenges in connected device design and test.

Moderator: Rich Nass, Editorial Director, TechInsights

Panelists:

• Brett Murphy, Manager, Technical Marketing, Verification, Validation & Test, The MathWorks, Inc.
• Shelley Gretlein, Senior Group Manager, Real-Time and Embedded Software, National Instruments
• Chris Loberg, Senior Marketing Manager, Tektronix
• Robert Oshana, Director, Global SW R&D, Networking and Multimedia Systems, Freescale Semiconductor

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