No BSD License
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B2(X,s)
function for Mult Fdbk BPF
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B2w(R1,R2,R3,C1,C2,w)
function for MFBPF
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B3(X,s)
fcn for Delyiannis BPF
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B5(X,s)
fcn for LTC1562 BPF
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B6(X,s)
matrix fcn for Sallen & Key BPF
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DA2(X);
function for dc diffamp
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DA3(RR);
function for dc diffamp
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G1(X,s)
bpf function with matrices
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G2a(X)
RTD function
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G3(X,s)
Sallen & Key BPF transfer function
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G4(X,s)
All-pass circuit function
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G5(X,s)
buffered 60Hz notch filter
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G6(X)
fcn for offsets.m offset analysis
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L2(X,s)
fcn for Butterworth LPF
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SCF(X,s)
function for SCF
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T2(X,s)
fcn for twin-T passive notch filter
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[A,B]=bw3(X)
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[A,B]=vo6(X)
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dydt=ps3(t,v,flag,A,B)
called by ODE function
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f=c100(X)
100 Hz comparator clock generator
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frac(x)
Fractional value of x
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y=HWR(V1,w,t,T)
half-wave rectified sine wave
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y=VA7(R1,R2,R3,R4,R5,R6,R9,R1...
uA733 Video Ampl analysis
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y=ccs(R1,R2,R3,Be,E3)
constant current sources for uA733
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y=simp3a(V,n)
Simpon's 3/8 rule integration routine
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y=tc(Ra,Rb,Eref)
Voltage divider test circuit
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allpass2.m
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bpfinflpts.m
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bpfrss3.m
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buff60.m
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bwdiff.m
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bwfil3mca.m
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centdiff.m
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comp100.m
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daratio.m
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dftvivo6.m
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diffamp.m
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fig1819.m
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fmcabpf1.m
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fmcadely.m
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fmcadiff.m
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fmcatwint.m
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genorm.m
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hwrsine2.m
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lm158pol.m
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lm158ta.m
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lpfrss2.m
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ltc1562.m
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mcabpf.m
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mcasallen.m
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offsets.m
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pcyield.m
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rtdbimod.m
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rtdmca3.m
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rtdrss.m
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rtdskewmca.m
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sakrsstf.m
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scfbpf.m
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senseqns.m
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skevafmcatf.m
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temptest.m
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uA733.m
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View all files
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| pcyield.m |
% Percent yield of diff amp
% File: pcyield.m
% uses function DA2.m
% Updated 11/06/06
clear;clc;
R1=10;R2=100;R3=10;R4=100;E1=1;E2=-1;
X=[R1 R2 R3 R4 E1 E2];
Vo=DA2(X);
Nk=200; % Number of samples
Nc=size(X,2);
randn('state',sum(100*clock)); % randomize seed for RNG.
Rn=zeros(Nk,Nc);Vm=zeros(Nk,1);
% set test limits at desired levels
% UL = Vo+0.7; LL = Vo-0.7
UL=20.7;LL=20-0.7;LM=[LL UL];
%
for r=1:5 % Try different resistor tolerances
% clear fail counters
flo=0;fhi=0;
Tr=r/100;Te=0.05; % when r=1, Tr-0.01 = 1%, etc.
Trm(r)=Tr;Tem(r)=Te;
T=[ -Tr -Tr -Tr -Tr -Te -Te;Tr Tr Tr Tr Te Te];
for k=1:Nk
for p=1:Nc
Rn(p,k)=X(p)*(((T(2,p)-T(1,p))/6)*(randn+3)+T(1,p)+1);
end
Vm(k)=DA2(Rn(:,k));
% catch high failures
if Vm(k)>UL;fhi=fhi+1;end
% catch low failures
if Vm(k)<LL;flo=flo+1;end
end
NFH(r)=fhi;NFL(r)=flo;
pcy(r)=100*(1-(fhi+flo)/Nk); % Percent yield
Vs=3*std(Vm);Vavg=mean(Vm); % Mean & standard deviation
Vhi(r)=Vavg+Vs;Vlo(r)=Vavg-Vs;
end
disp('Display upper limit and lower limit in Volts dc.')
LM
disp('Number of samples')
Nk
disp('Display data matrix MV')
disp('row 1 of MV: Resistor decimal tolerances')
disp('row 2; Input voltage tolerances in decimal percent')
disp('row 3; Vavg - 3sigma = Vavg - Vs for that resistor tolerance')
disp('row 4; Vavg + 3sigma = Vavg + Vs " " " "')
disp('row 5; Number of runs failing high " " " "')
disp('row 6; Number of runs failing low " " " "')
disp('row 7; Percent yield " " " "')
disp(' ')
%
MV=[Trm;Tem;Vlo;Vhi;NFH;NFL;pcy]
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