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Model-in-the-Loop for Embedded System Test (MiLEST) preliminary version

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Model-in-the-Loop for Embedded System Test (MiLEST) preliminary version

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22 Mar 2011 (Updated )

This is a draft preliminary version of the MiLEST Framework for eduction purpose.

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Description

In Model-in-the-Loop for Embedded System Test (MiLEST) the developed signal-feature – oriented paradigm allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows as well as the issue of systematic test data selection. Numerous signal features are identified. Furthermore, predefined test patterns help build hierarchical test specifications, which enables a construc-tion of the test specification along modular divide-and-conquer principles. The processing of both discrete and continuous signals is possible, so that the hybrid behavior of embedded systems can be addressed.
The testing with MiLEST starts in the requirements phase and goes down to the test execution level. The essential steps in this test process are automated, such as the test data generation and test evaluation to name the most important.

Required Products Communications System Toolbox
MATLAB release MATLAB 7.5 (R2007b)
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Comments and Ratings (2)
13 Nov 2013 Justyna Zander

This version is now complemented by another submission. The extension is also available at https://github.com/justynazander/MiLEST for branching, forking, and redevelopment.

11 Jan 2013 Udomsak Boonprasert  
Updates
11 Mar 2013

Preliminary version. To be followed by the full version.

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