Rank: 2539 based on 18 downloads (last 30 days) and 2 files submitted
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Siddharth Shankar

E-mail
Company/University
The MathWorks
Lat/Long
42.30174255371094, -71.37747955322266

Personal Profile:

I'm a software developer for Stateflow at MathWorks. Before this, I worked in MathWorks technical support in the area of Test & Measurement.

Professional Interests:
Software development, GUI building, Instrument Control, Data Acquisiton

 

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05 Oct 2009 Reverse Token Order Reverse the order of words in a string. Author: Siddharth Shankar string reverse tokens, string manipulation 0 0
26 May 2009 Two Port S-Parameter Measurement Perform a 2-port s-parameter measurement using the Instrument Control Toolbox. Author: Siddharth Shankar agilent, signal processing, modelling, rf, measurement, simulink 18 1
  • 3.0
3.0 | 2 ratings
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27 May 2009 Two Port S-Parameter Measurement Perform a 2-port s-parameter measurement using the Instrument Control Toolbox. Author: Siddharth Shankar
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23 Sep 2010 Two Port S-Parameter Measurement Perform a 2-port s-parameter measurement using the Instrument Control Toolbox. Author: Siddharth Shankar Sodhi, Raj

The post is appreciated, but the code doesn't work. There is a function that uses a variable 'visaObj', but this isn't passed. Needs more debugging.

yours,

Raj

function localConfigurePNA(fileFormat)
%% Preset system
% SYSTem:PRESet
% OPC? = All Operations Complete? +1 for Yes
fprintf(visaObj,'SYST:PRES');
localWaitForSystemReady(visaObj);
27 May 2009 Two Port S-Parameter Measurement Perform a 2-port s-parameter measurement using the Instrument Control Toolbox. Author: Siddharth Shankar Shankar, Siddharth
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agilent, instrument control, measurement, modelling, pna
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Updated   File Tags Downloads
(last 30 days) 		Comments Rating
05 Oct 2009 Reverse Token Order Reverse the order of words in a string. Author: Siddharth Shankar string reverse tokens, string manipulation 0 0
26 May 2009 Two Port S-Parameter Measurement Perform a 2-port s-parameter measurement using the Instrument Control Toolbox. Author: Siddharth Shankar agilent, signal processing, modelling, rf, measurement, simulink 18 1
  • 3.0
3.0 | 2 ratings

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