Hecate

Version 1.0.0.0 (322 KB) by Federico Formica

Hecate is a testing tool for automatic test case generation of Simulink models using Test Sequence and Test Assessment blocks.

https://github.com/Hecate-SBST/Hecate

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Updated 11 Oct 2024

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Hecate is a testing approach for Simulink models using the Test Sequence and Test Assessment blocks. It relies on information provided by the Test Sequence and Test Assessment blocks to guide the search procedure towards falsification of given requirements.

Cite As

Formica, Federico, et al. “Simulation-Based Testing of Simulink Models With Test Sequence and Test Assessment Blocks.” IEEE Transactions on Software Engineering, vol. 50, no. 2, Institute of Electrical and Electronics Engineers (IEEE), Feb. 2024, pp. 239–57, doi:10.1109/tse.2023.3343753.

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MATLAB Release Compatibility

Created with R2022a

Compatible with R2022a and later releases

Platform Compatibility

Windows macOS Linux

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staliro

staliro/auxiliary

staliro/optimization

staliro/optimization/auxiliary

Version	Published	Release Notes
1.0.0.0	11 Oct 2024		Zip Toolbox

MLA	Formica, Federico, et al. “Simulation-Based Testing of Simulink Models With Test Sequence and Test Assessment Blocks.” IEEE Transactions on Software Engineering, vol. 50, no. 2, Institute of Electrical and Electronics Engineers (IEEE), Feb. 2024, pp. 239–57, doi:10.1109/tse.2023.3343753.
APA	Formica, F., Fan, T., Rajhans, A., Pantelic, V., Lawford, M., & Menghi, C. (2024). Simulation-Based Testing of Simulink Models With Test Sequence and Test Assessment Blocks. IEEE Transactions on Software Engineering, 50(2), 239–257. Institute of Electrical and Electronics Engineers (IEEE). Retrieved from http://dx.doi.org/10.1109/TSE.2023.3343753
BibTeX	@article{Formica_2024, title={Simulation-Based Testing of Simulink Models With Test Sequence and Test Assessment Blocks}, volume={50}, ISSN={2326-3881}, url={http://dx.doi.org/10.1109/TSE.2023.3343753}, DOI={10.1109/tse.2023.3343753}, number={2}, journal={IEEE Transactions on Software Engineering}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Formica, Federico and Fan, Tony and Rajhans, Akshay and Pantelic, Vera and Lawford, Mark and Menghi, Claudio}, year={2024}, month=feb, pages={239–257} }