CVDD

Hu, Lianyu, and Caiming Zhong. “An Internal Validity Index Based on Density-Involved Distance.” IEEE Access, vol. 7, Institute of Electrical and Electronics Engineers (IEEE), 2019, pp. 40038–51, doi:10.1109/access.2019.2906949.

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Version	Published	Release Notes	Action
1.0	22 Oct 2021		Download

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MLA	Hu, Lianyu, and Caiming Zhong. “An Internal Validity Index Based on Density-Involved Distance.” IEEE Access, vol. 7, Institute of Electrical and Electronics Engineers (IEEE), 2019, pp. 40038–51, doi:10.1109/access.2019.2906949.
APA	Hu, L., & Zhong, C. (2019). An Internal Validity Index Based on Density-Involved Distance. IEEE Access, 7, 40038–40051. Institute of Electrical and Electronics Engineers (IEEE). Retrieved from http://dx.doi.org/10.1109/ACCESS.2019.2906949
BibTeX	@article{Hu_2019, title={An Internal Validity Index Based on Density-Involved Distance}, volume={7}, ISSN={2169-3536}, url={http://dx.doi.org/10.1109/ACCESS.2019.2906949}, DOI={10.1109/access.2019.2906949}, journal={IEEE Access}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Hu, Lianyu and Zhong, Caiming}, year={2019}, pages={40038–40051} }

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