Data Weighted Averaging for Simulink
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The SIMULINK- models of multibit Delta-Sigma ADC and Delta-Sigma DAC all have a non-ideal D/A-converter.
The DAC mismatch noise will be shaped according to a general Data Weighted Averaging (DWA) transfer function 1±z^(-D), where D is a positive integer.
The DWA element selection logic calculates a selection vector. The selection vector chooses, which of the unit DACs will be used according to DAC input.
The DWA block is constructed using mainly fixed-point blocks.
Models for Incremental DWA (IDWA) were also added.
This package also includes a spurious tone estimator: the spurs can be estimated using the DS input signal and the DNL error shape.
Comments and Ratings (5)
Updates
| 1.4.0.0 | A bugfix: the spur estimator now supports all DWA modes (i.e. noise shaping transfer functions). |
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| 1.3.0.0 | Feature update: spurious tone estimator.
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| 1.2.0.0 | Added three simulation models for Delta-Sigma D/A converters. |
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| 1.1.0.0 | Major improvement. The DWA-DAC is now more realistic. Also added a model that uses incremental DWA. |
MATLAB Release Compatibility
Platform Compatibility
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Acknowledgements
Inspired by: Delta Sigma Toolbox, Modulo Time Plot
Inspired: Quadrature Data Weighted Averaging, Multibit CT DS ADC with DWA and ISI-Mitigation
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Tsanming XIA (view profile)
Thank you so much for sharing the valuable material
Neo Ding (view profile)
Marko Neitola (view profile)
This model and the related paper (mentioned previously) were also a part of my Ph.D. thesis:
http://herkules.oulu.fi/isbn9789514297496/isbn9789514297496.pdf
Marko Neitola (view profile)
The mismatch noise estimator was improved ad added to submission #29522: "Delta Sigma converter spurious tone predictor".
Both DWA mismatch noise model and DSM quantization noise models can be found in #29522.
Marko Neitola (view profile)
More information about this model:
Neitola, M., Rahkonen, T.: A Generalized Data-Weighted Averaging Algorithm. Circuits and Systems II: Express Briefs, IEEE Transactions on, Volume: 57 , Issue: 2, Publication Year: 2010 , Page(s): 115 - 119
Available on IEEE Xplore