Optical Design and Simulation Library for Image Processing Toolbox

Optical design and simulation, ray tracing, spot diagrams, aberrations, lens distortion, and field curvature analysis

Design and simulate optical systems using the Optical Design and Simulation Library for Image Processing Toolbox™. The library supports end‑to‑end optics workflows, enabling you to:

• Model optical systems using spherical, aspheric, biconic, and grid-sag optical surfaces, with support for importing optical designs from ZMX files.
• Evaluate optical system performance using ray tracing and image quality analysis tools, including PSF, MTF, OPD, spot diagrams.
• Render test charts through optical systems to simulate image formation and evaluate optical performance and image quality.
• Perform optical system tolerancing using sensitivity analysis and Monte Carlo simulation to assess the impact of manufacturing variations on system performance.
• Optimize optical systems and coatings as part of broader design workflows using tools available in Optimization Toolbox™.
• Model optical materials and coatings using material libraries, custom materials, multilayer coatings, and coating analysis tools.
• Integrate optical system models with MATLAB® and Simulink® workflows to support system-level modeling and simulation.
• Interactively model and analyze optical systems with the Optical System Designer app

To get started with the Optical Design and Simulation Library for Image Processing Toolbox, see Optical System Design and Analysis. Explore examples on how you can analyze and build optical systems and coatings.

You can install the Optical Design and Simulation Library for Image Processing Toolbox from the Add-On Explorer. For more information about installing add-ons, see Get and Manage Add-Ons.

Examples

• Analyze Optical System Using Optical System Designer
• Optimize Monochromatic Camera Lens System for Type 2/3 Sensor
• Create Human Eye Model Schematic
• Simulate Image Using Spatially Variant PSF
• Model Dynamic Optical Systems with Scanning Elements
• Improve Manufacturing Yield Using Monte Carlo Analysis