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Submitted
Ellipsometry for Measurement of Transparent Ultra-Thin Films
Five-step spectroscopic ellipsometry fit of thickness and Cauchy dispersion for transparent ultra-thin SiO2 films on silicon
3 days ago | 2 downloads |
Submitted
Fourier ellipsometry simulation
This code demonstrates the working principle of a PCCA-configured Fourier ellipsometry, showing its sensitivity regarding film t...
1 year ago | 1 download |
